Iwatsu B-H Analyzer Catalogue

Soft Magnetic Materials Property Tests

Iwatsu B-H analyzers provide highly accurate, automatic measurement at high frequency.

Main systems

• SY-8218 B-H Analyzer: 10 Hz to 10 MHz
• SY-8219 B-H Analyzer: 10 Hz to 1 MHz
• SY-330 Wide-Temperature Scanner System: -55 °C to +180 °C; compatible with AEC-Q200 Grade 0
• SY-320A / SY-321A Temperature Scanner Systems: -30 °C to +150 °C
• SY-960 / SY-961 / SY-962 DC-Bias Test System: up to 30 A DC bias
• SY-956 Single-Sheet Test System: samples from 36 mm long, up to 35 mm wide and 3 mm thick

Precise Magnetic-Property Measurement at High Frequency

Precise and accurate core-loss measurement

Iwatsu B-H analyzers use the CROSS-POWER method, compatible with IEC 62044-3. The method minimizes phase-error effects across the frequency spectrum through current-detection resistors and amplitude- and phase-compensated detection circuitry.

The third-generation instruments are intended to support leading-edge power-management development.

System highlights

• Wide frequency range from 10 Hz to 10 MHz with the SY-8218
• Automatic scanning of up to 41 specimens from -30 °C to +150 °C with the SY-321A
• High-power SY-5001 amplifier: up to ±150 V, ±6 A, DC to 5 MHz
• SY-956 single-sheet testing for samples at least 36 mm long and up to 35 mm wide
• DC-bias superposition testing up to 30 A with the SY-960, SY-961 and SY-962
• SY-810 remote-control software

System components

• SY-8218 / SY-8219 B-H Analyzer
• SY-330 Wide-Temperature Scanner
• SY-320A / SY-321A Temperature Scanner
• SY-960 DC-Bias Test Fixture
• SY-961 DC-Bias Source
• SY-962 AC Blocker
• SY-956 Single-Sheet Tester
• SY-5001 / SY-5002 Bipolar Power Amplifier

Supported Soft Magnetic Materials

Materials

• Ferrite
• Permalloy
• Amorphous material
• Silicon-steel sheet
• Powder core

Sample shapes

• Toroidal core
• EE core
• EI core
• Sheet or ribbon
• Powder material
• Wound core

The SY-513 toroidal-shape case is available for sheet toroids and powder-material measurements.

Fully Automatic Testing

Enter the sample parameters and test conditions, then start the measurement. The analyzer automatically obtains the B-H hysteresis curve and magnetic-property values.

Sample parameters

• Le: magnetic path length
• Ae: cross-sectional area
• Ve: volume
• We: weight
• N1: primary winding turns
• N2: secondary winding turns

Test conditions

• Sine or pulse waveform
• Frequency
• Magnetic-field strength
• Flux density
• Total magnetic flux
• Target excitation based on Hm, Bm, I1m or V2m

SY-810 remote-control modes

• Schedule menu
• Condition menu
• Semi-manual menu
• Automatic-test menu

The SY-810 software supports the temperature-scanner, single-sheet, and DC-bias systems.

B-H Analyzers SY-8218 / SY-8219

Key capabilities

• SY-8218 test frequency: 10 Hz to 10 MHz
• SY-8219 test frequency: 10 Hz to 1 MHz
• Signal waveform: sine, or pulse from 10 Hz to 1 MHz
• Maximum input current: ±6 A
• Maximum input voltage: ±200 V
• Excitation method: automatic excitation targeting Hm, Bm, I1m or V2m
• Automatic degaussing after excitation to avoid residual magnetization

Specifications

Measurement items

• Maximum magnetic flux density (Bm)
• Residual magnetic flux density (Br)
• Maximum magnetic-field strength (Hm)
• Coercive force (Hc)
• Squareness ratio (Br/Bm)
• Relative amplitude permeability (μa)
• Core loss (Pc, Pcv, Pcm)
• Primary excitation current (I1m)
• Secondary induced voltage (V2m)
• Phase (θ)
• Total magnetic-flux linkage (2φm)
• Apparent power (VA)
• Impedance permeability (μz)
• Complex permeability (μ′, μ″)
• Loss coefficient (tan δ)
• Inductance (L)
• Resistance (R)
• Impedance (|Z|)
• Quality factor (Q)
• Total harmonic distortion (THD)

Waveform displays

• B-H curve
• Primary current
• Secondary voltage
• Magnetic field
• Magnetic flux

Included accessories

• Measurement POD cover
• SY-504 AC coupler
• BNC-to-BNC power-amplifier cable
• BNC-to-SMA oscilloscope cable
• Power cable
• User guide
• Instruction manual on CD-ROM

Bipolar Power Amplifiers

The SY-5001 and SY-5002 are wide-band, high-power bipolar amplifiers for the B-H analyzers.

Comparison

SY-5001

SY-5002

Temperature Scanner Systems

SY-330 Wide-Temperature Scanner

• Temperature range: -55 °C to +180 °C
• Capacity: up to four large samples
• Compatible with AEC-Q200 Grade 0 testing

SY-330 accessories

• SY-912 chamber cable
• RS-232C cable
• SY-512 pushing jig
• Power cable
• Manual

SY-320A / SY-321A Temperature Scanner Systems

• Temperature range: -30 °C to +150 °C
• SY-320A capacity: 20 samples
• SY-321A capacity: 41 samples

Accessories and consumables

• SY-910 chamber cable
• 1 m GPIB cable
• Power cable
• Instruction manual
• SY-510 turntable for SY-320A
• SY-511 turntable for SY-321A
• SY-512 spare contact-pin set for SY-320A / SY-321A

Remote-control configuration

The systems can be controlled using a PC running SY-810 software. Depending on the configuration, the system uses:

• SY-509 USB-to-GPIB converter
• National Instruments NI GPIB-USB-HS+
• National Instruments NI USB-232
• RS-232 cable
• Power-amplifier cable SY-921
• SY-910 or SY-912 chamber connection cable

SY-956 Single-Sheet Test System

AC B-H analysis of sheet and ribbon samples

• Test frequency: 10 Hz to 20 kHz
• Maximum magnetic-field strength: approximately 10,000 A/m with 5 A excitation current
• Sample length: 36 mm or longer
• Maximum sample width: 35 mm
• Maximum sample thickness: 3 mm
• Vertical single-yoke test method
• Compatible with IEC 60404-3
• Yoke core-loss compensation
• Controllable pressing pressure for improved test reproducibility

Specifications

Included accessories

• SY-957 connection cable
• Two B-coil types
• Terminal screws
• Pincers
• Blowing brush
• Accessory case
• Power cable
• Instruction manual

B coils

A custom B coil can be wound with a preferred number of turns.

Magnetic-sheet characteristics may vary according to sample shape and the forming process applied before or after measurement.

SY-514 LF AC Coupler

The SY-514 helps eliminate power-amplifier offset voltage and permits measurement with a cutoff frequency of approximately 300 Hz. The standard SY-504 AC coupler has a cutoff frequency of approximately 10 kHz.

• Maximum input voltage: ±200 V
• Maximum input current: ±6 A
• Standard cable: 0.6 m BNC cable

SY-513 Toroidal-Shape Case

The SY-513 is intended for sheet-toroid and powder-material measurements.

• It is not heat-resistant or pressure-resistant.
• If a powder material is press-compressed during manufacturing, the SY-513 cannot reproduce the same conditions as the original manufacturing press process.

DC-Bias Tester SY-960 / SY-961 / SY-962

AC B-H analysis with DC bias

System components

• SY-960: DC test fixture
• SY-961: DC-bias source
• SY-962: AC blocker

Key capabilities

• Maximum DC bias: 30 A
• Maximum AC ripple: ±6 A
• Sine-wave test frequency: 10 kHz to 3 MHz
• Pulse test frequency: 10 kHz to 1 MHz
• Pulse duty cycle: 10% to 90%

The lowest usable sine-wave frequency may be 10 kHz or higher, depending on the specimen inductance.

The system supports pulse excitation with triangular specimen current or sine-wave excitation with superimposed DC bias.

Example applications

• Chip-inductor testing under chopper excitation
• Hysteresis-curve comparison as DC bias increases at a fixed ΔH
• Core-loss comparison against DC-bias level
• Power toroidal inductors
• SMD power-chip inductors
• Ferrite, amorphous and iron-powder cores

Example inductances shown in the catalogue include:

• Ferrite: 1.0 µH
• Amorphous core: 311 µH
• Iron-powder core: 8.4 µH

SY-810 B-H Analyzer Remote-Control Software

Automation with multiple test conditions

• Up to 20 temperature conditions
• Up to 40 excitation conditions
• Up to 800 test-condition combinations per sample
• Test waveform export in CSV format
• Display hardcopy export in JPEG or PNG format
• Automatic control of the SY-330, SY-320A, SY-321A, DC-bias tester and single-sheet test system

PC interface and supplied components

The SY-810 package includes:

• Software and PDF operating manual on CD
• SY-509 GPIB adapter
• Bulkhead adapter 182766-01
• Software license agreement

A National Instruments NI GPIB-USB-HS+ interface is required to connect a PC to the SY-8218 or SY-8219. The PC is supplied by the customer.

Listed system requirements

• Windows Vista SP2
• Windows 7, 32-bit or 64-bit
• Windows 8, 32-bit or 64-bit
• Windows 10, 32-bit or 64-bit
• .NET Framework
• Pentium 133 MHz or faster CPU
• At least 64 MB memory
• Display resolution of at least 1024 × 768
• Three USB ports

Contact Iwatsu for the currently recommended system configuration.

Optional SY-811 Continuous-Test Function

The SY-811 enables time-dependent property testing under continuous excitation.

• Maximum test duration: 99,999 minutes, approximately 70 days
• Maximum interval: 60 seconds per test
• Two properties can be monitored on the display and stored in memory
• The measurement item can be changed during a test
• Reference and test results can be compared on the same display
• Test data can be exported as CSV
• Display hardcopies can be saved as JPEG or PNG

The SY-811 is a built-in option for the SY-8218 and SY-8219. Installation at the customer site requires return of the analyzer to the factory for installation and inspection.

Notices and Contact Information

Specifications and designs are subject to change without notice. Company and product names are trademarks or registered trademarks of their respective owners.

Some products may be regulated under Japan's Foreign Exchange and Foreign Trade Control Law and may require governmental authorization before export. Contact Iwatsu to confirm whether a product is regulated.

Iwatsu Electric Co., Ltd.
Overseas Sales Section
Test & Measurement Solution Sales Department
7-41, Kugayama 1-chome
Suginami-ku, Tokyo 168-8501, Japan
Telephone: +81-3-5370-5483
Fax: +81-3-5370-5492
Website: https://www.iti.iwatsu.co.jp/index_e.html

Catalogue reference: CS(OG)2307-845-6-00